Publications

Publications:
1. Voon C. Khoo (2004) “Cost of Test Case Study for Multi-site Testing in Semiconductor Industry with Firm Theory,” International Journal of Business and Management Invention, Volume 3, Issue 4, pp. 14-27.
2. Voon C. Khoo (2004) “A case study on the effectiveness of Wafer-Ring Multi-sites test handler to improve of Production Output,” Akamai University, Journal for Advancement of the Human Condition, Year 2014.
3. Voon C. Khoo (2004) “Case study on the profit margin model of multi-site testing technology for semiconductors,” American Journal of Engineering Research (AJER), Volume-03, Issue-04, pp-17-23.
4. Voon C. Khoo (2004) “A case study on the effectiveness of Multi-sites test handler to improve of Production Output,” IOSR Journal of Engineering (IOSRJEN), Vol. 04, Issue 04 (April. 2014), pp-47-59.
5. Khoo, V.C. 2014. “Case Study on the Profit Margin Model of Wafer-Ring Testing Handler for Semiconductors”. Pacific Journal of Science and Technology. 15(1):149-167.
6. Ching, K. V. (2016). A Case Study Of Cost Deduction In Multi-Site Testing For The Semiconductor Industry. North Charleston, SC: Createspace.
7. Khoo, V. C. (2015). A Cost Of Test Case Study For Wafer-Ring Multi-Sites Test Handler In Semiconductor’s Industry Through Theory Of The Firm. Jurnal Teknologi, 73(1).
8. Ching, K. V. (2016) THE FRAMEWORK OF ECAMPUS AND ITS EFFECTIVENESS IN DISTANCE LEARNING. ASEAN Journal of Open Distance Learning, pp-43-54.
9. Khoo, V. C. (2013). Management of technology: a case study of cost deduction in multi-site testing for the semiconductor industry (Doctoral dissertation, Asia e University).